negative example
Beyond Myopia: Learning from Positive and Unlabeled Data through Holistic Predictive Trends
Learning binary classifiers from positive and unlabeled data (PUL) is vital in many real-world applications, especially when verifying negative examples is difficult. Despite the impressive empirical performance of recent PUL methods, challenges like accumulated errors and increased estimation bias persist due to the absence of negative labels. In this paper, we unveil an intriguing yet long-overlooked observation in PUL: resampling the positive data in each training iteration to ensure a balanced distribution between positive and unlabeled examples results in strong early-stage performance. Furthermore, predictive trends for positive and negative classes display distinctly different patterns. Specifically, the scores (output probability) of unlabeled negative examples consistently decrease, while those of unlabeled positive examples show largely chaotic trends. Instead of focusing on classification within individual time frames, we innovatively adopt a holistic approach, interpreting the scores of each example as a temporal point process (TPP).
Convex Two-Layer Modeling with Latent Structure
Vignesh Ganapathiraman, Xinhua Zhang, Yaoliang Yu, Junfeng Wen
Unsupervised learning of structured predictors has been a long standing pursuit in machine learning. Recently a conditional random field auto-encoder has been proposed in a two-layer setting, allowing latent structured representation to be automatically inferred. Aside from being nonconvex, it also requires the demanding inference of normalization. In this paper, we develop a convex relaxation of two-layer conditional model which captures latent structure and estimates model parameters, jointly and optimally. We further expand its applicability by resorting to a weaker form of inference--maximum a-posteriori. The flexibility of the model is demonstrated on two structures based on total unimodularity--graph matching and linear chain. Experimental results confirm the promise of the method.
Improved Deep Metric Learning with Multi-class N-pair Loss Objective
Deep metric learning has gained much popularity in recent years, following the success of deep learning. However, existing frameworks of deep metric learning based on contrastive loss and triplet loss often suffer from slow convergence, partially because they employ only one negative example while not interacting with the other negative classes in each update. In this paper, we propose to address this problem with a new metric learning objective called multi-class N-pair loss. The proposed objective function firstly generalizes triplet loss by allowing joint comparison among more than one negative examples - more specifically, N-1 negative examples - and secondly reduces the computational burden of evaluating deep embedding vectors via an efficient batch construction strategy using only N pairs of examples, instead of (N+1) N. We demonstrate the superiority of our proposed loss to the triplet loss as well as other competing loss functions for a variety of tasks on several visual recognition benchmark, including fine-grained object recognition and verification, image clustering and retrieval, and face verification and identification.